Computerized scanning Auger microprobeSOMMERER, T. J; HALE, E. B.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1985, Vol 3, Num 4, pp 1874-1880, issn 0734-2101Article

SA : An Auger spectroscopy quantification programDOUST, T.Le Vide (1995). 1996, Vol 52, Num 279, issn 1266-0167, p. 105Conference Paper

Quantification de la spectroscopie Auger dans des études de ségrégation : problèmes posés, solutions et limites = Quantification of Auger spectroscopy in segregation studies: problems, solutions an limitsROLLAND, A.Le Vide (1995). 1996, Vol 52, Num 279, pp 111-113, issn 1266-0167Conference Paper

Problèmes posés par l'analyse de matériaux isolants en spectroscopie d'électrons Auger = Problems of isolating material analysis in Auger spectroscopyJARDIN, C; RENOUD, R.Le Vide (1995). 1996, Vol 52, Num 279, pp 106-110, issn 1266-0167Conference Paper

AES-XPS : état des lieuxLe Vide (1995). 1996, Vol 52, Num 279, issn 1266-0167, 136 p.Conference Proceedings

Application of the pattern recognition method to electron spectroscopies (AES and XPS)LESIAK, B.Le Vide (1995). 1996, Vol 52, Num 279, pp 99-102, issn 1266-0167Conference Paper

Effets instrumentaux et normalisation des spectres = Instrumental effects and spectra normalisationLORANG, G.Le Vide (1995). 1996, Vol 52, Num 279, issn 1266-0167, 7, 34-43 [11 p.]Conference Paper

Commemoration of the 25th anniversary of Auger electron spectroscopyGERGELY, G.Vacuum. 1994, Vol 45, Num 2-3, pp 311-313, issn 0042-207XConference Paper

Development of a reference material and reference method to provide a calibration of the instrument intensity scale for differential AESSEAH, M. P; HUNT, C. P; TOSA, M et al.Journal of electron spectroscopy and related phenomena. 1993, Vol 61, Num 2, pp 149-171, issn 0368-2048Article

Contribution à l'étude de la croissance et de la morphologie de particules de palladium et nickel sur un support céramique = Study of the morphology and growth of palladium and nickel particles on a ceramic substrateRicci, Marc; Gillet, Marcel.1991, 125 p.Thesis

INITIAL OXIDATION STUDIES ON FE (100) BY MEANS OF PHOTOELECTRIC WORK FUNCTION MEASUREMENTS COMBINED WITH AUGER ELECTRON SPECTROSCOPYUEDA K; SHIMIZU R.1974; SURF. SCI.; NETHERL.; DA. 1974; VOL. 43; NO 1; PP. 77-87; BIBL. 27 REF.Article

IN-DEPTH INFORMATION FROM AUGER ELECTRON SPECTROSCOPY.MEYER F; VRAKKING JJ.1974; SURF. SCI.; NETHERL.; DA. 1974; VOL. 45; NO 2; PP. 409-418; BIBL. 15 REF.Article

QUANTITATIVE AUGER ELECTRON SPECTROSCOPY OF GOLD CONDENSED ON ROCKSALT ON AMORPHOUS CARBONANTON R; HARSDORFF M.1974; THIN SOLID FILMS; NETHERL.; DA. 1974; VOL. 22; NO 2; PP. S23-S26; BIBL. 16 REF.Article

THE QUANTITATIVE DETERMINATION OF SURFACE OXIDE THICKNESS ON DEPOSITED METAL FILMS BY COMBINATION AUGER SPECTROSCOPY AND INERT GAS ION BOMBARDMENTHOLLOWAY DM.1973; APPL. SPECTROSC.; U.S.A.; DA. 1973; VOL. 27; NO 2; PP. 95-98; BIBL. 12 REF.Article

CORRELATION OF FRACTIONAL-MONOLAYER OXYGEN DETERMINATIONS OBTAINED BY PROTON-EXCITED RAY AND AUGER-ELECTRON SPECTROSCOPY ANALYSIS OF FE SURFACESNEEDHAM PB JR; DRISCOLL TJ; RAO NG et al.1972; APPL. PHYS. LETTERS; U.S.A.; DA. 1972; VOL. 21; NO 10; PP. 502-505; BIBL. 10 REF.Serial Issue

INTERFACIAL AUGER TRANSITIONS IN OXIDISED SODIUM AND MAGNESIUMJANSSEN AP; SCHOONMAKER R; MATTHEW JAD et al.1974; SOLID STATE COMMUNIC.; G.B.; DA. 1974; VOL. 14; NO 11; PP. 1263-1267; ABS. ALLEM.; BIBL. 10 REF.Article

AUGER-ELEKTRONENSPEKTROSKOPISCHE UNTERSUCHUNG VON KONTRASTIERSCHICHTEN AUF METALLEN = ETUDE PAR SPECTROSCOPIE AUGER DES COUCHES FORMANT CONTRASTE SUR LES METAUXHOFMANN S; EXNER HE.1974; Z. METALLKDE; DTSCH.; DA. 1974; VOL. 65; NO 12; PP. 778-781; ABS. ANGL.; BIBL. 22 REF.Article

Interlaboratory tests of a composite reference sample to calibrate Auger electron spectrometers in the differential modeSEAH, M. P; HUNT, C. P; SYKES, D et al.Journal of electron spectroscopy and related phenomena. 1993, Vol 61, Num 2, pp 173-182, issn 0368-2048Article

Effects of chemical state on quantitative AES of metal-sulfur compoundsGRIFFIS, D. P; LINTON, R. W.Surface and interface analysis. 1984, Vol 6, Num 1, pp 15-20, issn 0142-2421Article

Investigation of performance degradation in metallized film capacitorsGODEC, M; MANDRINO, Dj; GABERSCEK, M et al.Applied surface science. 2013, Vol 273, pp 465-471, issn 0169-4332, 7 p.Article

Practical energy scale calibration procedure for Auger electron spectrometers using a spectrometer offset functionFUJITA, D; YOSHIHARA, K.Surface and interface analysis. 1994, Vol 21, Num 4, pp 226-230, issn 0142-2421Article

Application of Auger electron spectrometry to trace analysis: determination of less than 10 ppm sulfur in copperHOFMANN, S; FRECH, R.Analytical chemistry (Washington, DC). 1985, Vol 57, Num 3, pp 716-719, issn 0003-2700Article

Instrumental effects in quantitative Auger electron spectroscopyPEACOCK, D. C; PRUTTON, M; ROBERTS, R et al.Vacuum. 1984, Vol 34, Num 5, pp 497-507, issn 0042-207XArticle

Etude par spectroscopie Auger, de la composition de la couche superficielle des catalyseurs du système rhodium-ruthéniumGRISHINA, T. M.Žurnal fizičeskoj himii. 1984, Vol 58, Num 8, pp 1984-1988, issn 0044-4537Article

Novye dannye o steklakh struktury ZhamanshinFRIKH-KHAR, D. I; TSILEK, V.Doklady Akademii nauk SSSR. 1983, Vol 271, Num 4, pp 959-961, issn 0002-3264Article